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Dme Spm. Some articles about Thermal Microscopy are published,

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Authors: Yaram Narasimhareddy,M.V.SubbaRao,V.Chandarasekhara Raju Assistant Professor pnc&kr college Narasarapet.
via timer-relay

ABSTRACT:- Nanomedicine is the process of diagnosing, treating, and preventing disease and traumatic injury, of relieving pain, and of preserving and improving human health, using molecular tools and molecular knowledge of the human body. In the relatively...
Studying post-etching silicon crystal defects on 300mm wafers by automatic defect review AFM
via marketing.electroiq

Atomic force microscopy is essential for obtaining three-dimensional information of crystal defects. ARDAVAN ZANDIATASHBARA, PATRICK A. TAYLORB, BYONG KIMA, YOUNG-KOOK YOOA, KEIBOCK LEEA, AHJIN JOC, JU SUK LEEC, SANG-JOON CHOC, and SANG-IL PARKC a...
Gaps In Metrology Could Impact Yield
via semiengineering

For some time, chipmakers have been developing new and complex chip architectures, such as 3D NAND, finFETs and stacked die. But manufacturing these types of chips is no simple task. It requires a robust fab flow to enable new IC designs with good yields...
Research Alert: February 3, 2015
via semimd

Fabrication of patterns with linewidths down to 1.5nm Researchers at aBeam Technologies, Lawrence Berkeley National Laboratory and Argonne National Laboratory have developed a technology to fabricate test patterns with a minimum linewidth down to 1...
Global Microscopy Devices Market Will Reach USD 6.2 Billion in 2018: Transparency Market Research
via culrav

Albany,NY (Aug 29, 2013) (CULRAV.ORG) - According to a new market report published by Transparency Market Research (http://www.transparencymarketresearch.com) “Microscopy Devices Market (Optical, Electron and Scanning Probe Microscopes...

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Publications about Thermal Microscopy In the last months, some articles about Thermal Microscopy are published, which you can find under SEM AFM Applications. The new controller C32 is...
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Why do you need a Scanning Probe Microscope The maximum obtainable magnification with a conventional optical microscope is app. 800 to 1000 times, because of the nature of light. For further magnific...

Atomic Force Microscope Scanner (AFM) DS 95-50 / DS 95-200

Scanner All scanners of the DS 95 series are probe scanners, i.e. during scanning, the cantilever is moved from side to side over the sample and thus provides examination of any samples. The laser...