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NBTI, PBTI Reliability at Device and Circuit Level - Global TCAD Solutions

One of the most critical degradation mechanisms in p-channel CMOS technologies is the negative bias temperature instability (NBTI). With the latest implementation of the nonradiative multiphonon (NMP)...
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Tutorial Getting Started - 32 - Output Characteristics Copy Settings - Global TCAD Solutions

2.1.10 Output Characteristics Copy Settings For simulating the output characteristics of the scaled device, we will proceed as described in 2.1.7 by copying the settings of ToolFolder 002 (output char...