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Global TCAD Solutions

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NBTI, PBTI Reliability at Device and Circuit Level - Global TCAD Solutions

One of the most critical degradation mechanisms in p-channel CMOS technologies is the negative bias temperature instability (NBTI). With the latest implementation of the nonradiative multiphonon (NMP)...

09 - Single Bias Point Simulation - Global TCAD Solutions

09 - Single Bias Point Simulation Switch to the Run to start the simulation You can watch the output log of the simulator. When the simulation is finished, you will see the result in the Device page...